Particle granularity and concentration light scattering measuring method

一种颗粒粒度及浓度光散射测量方法

Abstract

本发明公开了一种颗粒粒度光散射测量方法,包括如下步骤:步骤一:测量光强变化值为IΔtΣ(θ1)=It+ΔtΣ(θ1)-ItΣ(θ1),IΔtΣ(θ2)=It+ΔtΣ(θ2)-ItΣ(θ2);步骤二:粒径分布的测量,将两个散射角的光强变化值代入以下公式即可得到颗粒粒径尺寸分布函数步骤三:平均粒径的测量,将两个散射角的光强变化值IΔΣ(θ1)和IΔΣ(θ2)代入下式就可以求得平均粒径D30。本发明提供的一种颗粒粒度及浓度光散射测量方法,测量过程简单,易于标定,无需预知其中任一参数;并提出了两次测量法,避免粒度分布求解中的窗口污染对测量结果的影响。
The invention discloses a particle granularity light scattering measurement method. The method comprises the following steps: 1, measuring light intensity change values I delta t sigma (theta 1) = It + delta t sigma (theta 1)-It sigma(theta 1), I delta t sigma (theta 2) = It + delta t sigma (theta 2)-It sigma (theta 2); 2, measuring particle size distribution by substituting the light intensity change values of the two scattering angles into the following formula to obtain a particle size distribution function; and 3, measuring the average particle size by substituting the light intensity change values of the two scattering angles I delta sigma (theta 1) and I delta sigma (theta 2) into the formula below to obtain the average particle size D30. The particle granularity and concentration light scattering measuring method provided by the invention has the advantages of simple measurement process, easy calibration, and no requirement on knowing any parameter; and a twice measurement method is provided to avoid the influence of window pollution in particle size distribution solving on the measurement results.

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Patent Citations (0)

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NO-Patent Citations (2)

    Title
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    CN-105115866-ADecember 02, 2015清华大学单个纳米颗粒粒径的测量系统及测量方法
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